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Volumn 93, Issue 3, 2010, Pages 821-829

Yielding, strain hardening, and creep under nanoindentation of precursor-derived si-C-N ceramics

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SI; CLUSTER MODELS; COVALENT NETWORK; INDENTATION CREEP; INDENTATION SIZE EFFECTS; INDUCED STRAIN; ISOLATED REGIONS; LOAD DEPENDENCE; NANOINDENTATION LOAD-DISPLACEMENT CURVES; NUMBER DENSITY; OPTIMUM NETWORKS; REVERSE ANALYSIS; ROOM TEMPERATURE; SHEAR MODES; STRAIN RATE SENSITIVITY; STRAIN-HARDENING EXPONENT;

EID: 77649230303     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.03491.x     Document Type: Article
Times cited : (21)

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