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Volumn 351, Issue 12-13, 2005, Pages 1127-1132
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A DFT study of amorphous silicon oxynitride
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
APPROXIMATION THEORY;
COMPUTER SIMULATION;
GATES (TRANSISTOR);
GLASS;
MICROELECTRONICS;
MOLECULAR DYNAMICS;
OPTIMIZATION;
PHASE DIAGRAMS;
REFRACTIVE INDEX;
SILICA;
SILICON CARBIDE;
STOICHIOMETRY;
TOPOLOGY;
CHEMICAL STABILITY;
CONTINUOUS RANDOM ALTERNATING NETWORKS (CRAN);
GATE DIELECTRIC THICKNESS;
STRUCTURAL STABILITY;
AMORPHOUS MATERIALS;
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EID: 17744383817
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2005.01.026 Document Type: Conference Paper |
Times cited : (18)
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References (17)
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