Fracture in precursor-derived Si-C-N ceramics - Analysis of crack roughness and damage mechanisms

Journal of Non-Crystalline Solids

Volumn 355, Issue 43-44, 2009, Pages 2114-2121

  Janakiraman, Narayanan ^a,b   Aldinger, Fritz ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Atomic force and scanning tunneling microscopy; Ceramics; Crack growth; Fluctuations; Fracture; Special glasses and materials

Indexed keywords

ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPY; CERAMICS; CRACK GROWTH; FLUCTUATIONS; SPECIAL GLASSES AND MATERIALS;

AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; BRITTLE FRACTURE; CERAMIC MATERIALS; CRACK PROPAGATION; CRACKS; FAILURE (MECHANICAL); FRACTALS; GLASS; GROWTH (MATERIALS); HYDROGEN EMBRITTLEMENT; PHOTORESISTS; SCANNING TUNNELING MICROSCOPY; SILICON; STRUCTURAL PANELS; WIND TUNNELS;

FRACTURE TOUGHNESS;

EID: 70349083753     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.07.001     Document Type: Article

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