Copper segregation to the ∑5 (310)/[001] symmetric tilt grain boundary in aluminum

Interface Science

Volumn 12, Issue 2-3, 2004, Pages 165-174

  Campbell, Geoffrey H ^a   Plitzko, Jürgen M ^a,f   King, Wayne E ^a   Foiles, Stephen M ^b   Kisielowski, Christian ^c   Duscher, Gerd J M ^d,e  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d North Carolina State University   (United States)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

^f MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

Grain boundary; HREM; Segregation

Indexed keywords

ALUMINUM; BOUNDARY CONDITIONS; COPPER; ELECTRONIC STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; MATHEMATICAL MODELS; SEGREGATION (METALLOGRAPHY);

COPPER SEGREGATION; GRANULAR FRACTURE; METAL IMPURITIES;

GRAIN BOUNDARIES;

EID: 3543093435     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:INTS.0000028647.72322.90     Document Type: Conference Paper

References (45)

1. J.H. Westbrook, Metall. Rev. 9, 415 (1964).
2. W.D. Kingery, in Ceramic Microstructures '86 Role of Interfaces, edited by J.A. Pask and A.G. Evans (Plenum Press, New York, 1986), p. 281.
3. R. Rosenberg, J. Vac. Sci. Technol. 9, 263 (1972).
4. E.D. Hondros, Proc. Roy. Soc. A 286, 479 (1965).
5. M.C. Inman and H.R. Tipler, Metall. Rev. 8, 105 (1963).
6. D. Briggs and M.P. Seah, Practical Surface Analysis (Wiley, New York, NY, 1990).
7. E.D. Hondros and M.P. Seah, Scripta Metall. 6, 1007 (1972).
8. M.P. Seah and E.D. Hondros, Proc. Roy. Soc. A335, 191 (1973).
9. E. Bischoff, G.H. Campbell, and M. Rühle, Fresenius J. Anal. Chem. 337, 469 (1990).
10. P. Doig and P.E.J. Flewitt, Acta Metall. 29, 1831 (1981).
11. J.S. Vetrano, E.P. Simonen, and S.M. Bruemmer, Acta Mater. 47, 4125 (1999).
12. B.W. Krakauer and D.N. Seidman, Rev. Sci. Instrum. 63, 4071 (1992).
13. U. Alber, H. Mullejans, and M. Rühle, Acta Mater. 47, 4047 (1999).
14. D.E. Luzzi, M. Yan, M. Sob, and V. Vitek, Phys. Rev. Lett. 67, 1894 (1991).
15. S. Hofmann, in Surface Segregation Phenomena, edited by P.A. Dowben and A. Miller (CRC Press, Boca Raton, FL, 1990), p. 107.
16. S.M. Foiles, in Surface Segregation Phenomena, edited by P.A. Dowben and A. Miller (CRC Press, Boca Raton, FL, 1990), p. 79.
17. E.D. Hondros and M.P. Seah, Metall. Trans. A 8, 1363 (1977).
18. D. McLean, Grain Boundaries in Metals (Clarendon Press, Oxford, 1957).
19. I. Langmuir, J. Am. Chem. Soc. 37, 1139 (1915).
20. I. Langmuir, J. Am. Chem. Soc. 40, 1361 (1918).
21. M.P. Seah and E.D. Hondros, Scripta Metall. 7, 735 (1973).
22. S. Brunauer, P.H. Emmett, and E. Teller, J. Am. Chem. Soc. 60, 309 (1938).
23. S. Brunauer, L. Deming, W.E. Deming, and E. Teller, J. Am. Chem. Soc. 62, 1723 (1940).
24. R.H. Fowler and E.A. Guggenheim, Statistical Thermodynamics (Cambridge University Press, Cambridge, 1939).
25. E.J. Kirkland, Ultramicroscopy 15, 151 (1984).
26. S.J. Pennycook, S.D. Berger, and R.J. Culbertson, J. Microsc. - Oxford 144, 229 (1986).
27. X.Y. Liu, W. Xu, S.M. Foiles, and J.B. Adams, App. Phys. Lett. 72, 1578 (1998).
28. C.L. Liu, X.Y. Liu, and L.J. Borucki, Acta Mater. 47, 3227 (1999).
29. C.L. Liu, X.Y. Liu, and L.J. Borucki, App. Phys. Lett. 74, 34 (1999).
30. O. Kresse and J. Firthmüller, Phys. Rev. B 54, 11169 (1996).
31. W.E. King, G.H. Campbell, A.W. Coombs, G.W. Johnson, B.E. Kelly, T.C. Reitz, S.L. Stoner, W.L. Wien, and D.M. Wilson, in Joining and Adhesion of Advanced Inorganic Materials, edited by A.H. Carim, D.S. Schwarte and R.S. Silberglitt (Materials Research Society, Pittsburgh, PA, 1993), p. 61.
32. W.L. Wien, G.H. Campbell, and W.E. King, in Microstructural Science, edited by D.W. Stevens, E.A. Clark, D.C. Zipperian, and E.D. Albrecht (ASM International, Materials Park, OH, 1996), p. 213.
33. C. Kisielowski, C.J.D. Hetherington, Y.C. Wang, R. Kilaas, M.A. O'Keefe, and A. Thust, Ultramicroscopy 89, 243 (2001).
34. A. Strecker, J. Mayer, B. Baretzky, U. Eigenthaler, T. Gemming, R. Schweinfest, and M. Rühle, J. Microsc. - Oxford 48, 235 (1999).
35. M.A. O'Keefe, C.J.D. Hetherington, Y.C. Wang, E.C. Nelson, J.H. Turner, C. Kisielowski, J.-O. Malm, R. Mueller, J. Ringnalda, M. Pam, and A. Thust, Ultramicroscopy 4, 215 (2001).
36. W.M.J. Coene, A. Thust, M. deBeeck, and D. VanDyck, Ultramicroscopy 64, 109 (1996).
37. A. Thust, M. Lentzen, and K. Urban, Ultramicroscopy 53, 101 (1994).
38. D. Van Dyck, H. Lichte, and K.D. van der Mast, Ultramicroscopy 64, 1 (1996).
39. P.A. Stadelmann, Ultramicroscopy 21, 131 (1987).
40. G.H. Campbell, D. Cohen, and W.E. King, Microsc. Microanal. 3, 299 (1997).
41. J.M. Plitzko and J. Mayer, Ultramicroscopy 78, 207 (1999).
42. F. Thon, Z. Naturforsch. 20a, 154 (1965).
43. M. O'Keefe and V. Radmilovic, in Proceedings XIIIth International Congress for Electron Microscopy, edited by B. Jouffrey et all (Editions de physique, Les Ulis, 1994), p. 361.
44. A. Ziegler, C. Kisielowski, and R.O. Ritchie, Acta Mater. 50, 565 (2002).
45. M.R. Sørensen, Y. Mishin, and A.F. Voter, Phys. Rev. B 62, 3658 (2000).