Investigation of interface defects in nanocrystalline SnO2 by positron annihilation

Journal of Physics and Chemistry of Solids

Volumn 60, Issue 2, 1999, Pages 189-193

  Shek, C H ^a   Lai, J K L ^a   Lin, G M ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

A. Ceramics; A. Nanostructures; C. Positron annihilation spectroscopy; D. Defects

Indexed keywords

CERAMIC MATERIALS; COALESCENCE; DIFFUSION IN SOLIDS; GRAIN GROWTH; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; POINT DEFECTS; SHRINKAGE; SINTERING; SOL-GELS; THERMAL EFFECTS;

MICROVOIDS; MONOVACANCIES; POSITRON ANNIHILATION SPECTROSCOPY; TIN OXIDES;

TIN COMPOUNDS;

EID: 0033079977     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(98)00269-8     Document Type: Article

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