Fractal formation and tunnelling effects on the conductivity of Au/a-Ge bilayer films

Thin Solid Films

Volumn 322, Issue 1-2, 1998, Pages 194-197

  Zhiwen, Chen ^a   Shuyuan, Zhang ^a   Shun, Tan ^a   Mingliang, Tian ^a   Jianguo, Hou ^a   Yuheng, Zhang ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Fractal crystallization; Fractal dimension; Random Tunnelling Junction Network (RTJN) model; Resistance

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CRYSTALLIZATION; ELECTRIC RESISTANCE; GERMANIUM; SILVER;

RANDOM TUNNELLING JUNCTION NETWORK (RTJN) MODEL; TWO PROBE CONFIGURATION METHOD;

METALLIC FILMS;

EID: 0032496490     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00907-3     Document Type: Article

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