Effect of RF power on the optical and morphological properties of RF plasma polymerised linalyl acetate thin films

Applied Surface Science

Volumn 256, Issue 10, 2010, Pages 3293-3298

  Anderson, L J ^a   Jacob, M V ^a  

^a JAMES COOK UNIVERSITY   (Australia)

Author keywords

AFM; Optical band gap; Plasma polymerisation; Spectroscopic ellipsometry; Thin film; UV vis spectroscopy

Indexed keywords

DEPOSITION; ENERGY GAP; HARDNESS; OPTICAL BAND GAPS; OPTICAL PROPERTIES; PLASMA POLYMERIZATION; POLYMERS; SEMICONDUCTING FILMS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; ULTRAVIOLET VISIBLE SPECTROSCOPY;

ELECTRONIC DEVICE; ENCAPSULATION LAYER; FILM CHARACTERISTICS; MORPHOLOGICAL PROPERTIES; RADIO FREQUENCY PLASMA; SEMICONDUCTING LAYER; THIN-FILM PROPERTIES; UV-VIS SPECTROSCOPY;

OPTICAL FILMS;

EID: 77349127552     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.12.021     Document Type: Article

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