Optical properties of CuIn5Se8 and CuGa5Se8 from ellipsometric measurements

Materials Chemistry and Physics

Volumn 114, Issue 1, 2009, Pages 73-77

  Duran L ^a   Castro, J ^a   Naranjo, J ^b   Fermin J R ^a,c   Rincón, C A Durante ^a,c  

^a FACULTAD DE CIENCIAS VETERINARIAS   (Venezuela)

^b UNIVERSIDAD DEL ZULIA   (Venezuela)

^c LUZ Académico e Investigador de la Universidad Viña del Mar   (Venezuela)

Author keywords

Dielectric properties; Optical properties; Polarimeters and ellipsometers; Semiconductors

Indexed keywords

CERAMIC CAPACITORS; COPPER COMPOUNDS; CRYSTALS; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; LIGHT REFRACTION; OPTICAL PROPERTIES; ORGANIC POLYMERS; POLARIMETERS; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ELLIPSOMETRY;

AB SORPTION COEFFICIENTS; COMPLEX DIELECTRIC FUNCTIONS; COMPLEX REFRACTIVE INDICES; DIELECTRIC CONSTANTS; ELLIPSOMETRIC MEASUREMENTS; ENERGY GAP VALUES; EXPERIMENTAL DATUMS; HIGH FREQUENCIES; IMAGINARY PARTS; LINE SHAPES; ROOM TEMPERATURES; SECOND DERIVATIVES; SELLMEIER DISPERSION FORMULAS; SEMICONDUCTORS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 58149316220     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.08.020     Document Type: Article

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