Properties of Na0.55Bi0.55TiO3 ferroelectric films prepared by chemical solution decomposition

Journal of Crystal Growth

Volumn 284, Issue 1-2, 2005, Pages 136-141

  Yang, C H ^a   Wang, Z ^a,b   Li, Q X ^c   Wang, J H ^c   Yang, Y G ^a   Gu, S L ^a   Yang, D M ^a   Han, J R ^a  

^a SHANDONG UNIVERSITY   (China)

^b YANTAI UNIVERSITY   (China)

^c Shandong Metall Research Institute   (China)

Author keywords

A3. Polycrystalline decomposition; B1. Perovskites; B2. Ferroelectric materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; DECOMPOSITION; DIELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; LEAKAGE CURRENTS; PEROVSKITE; SILICON COMPOUNDS; SOLUTIONS; TITANIUM OXIDES; X RAY DIFFRACTION ANALYSIS;

ELECTRICAL MEASUREMENT; POLYCRYSTALLINE DECOMPOSITION;

SODIUM COMPOUNDS;

EID: 25144519270     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.06.038     Document Type: Article

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