Leakage current and charge carriers in (Na0.5Bi 0.5)TiO3 thin film

Journal of Physics D: Applied Physics

Volumn 38, Issue 4, 2005, Pages 642-648

  Zhou, Z H ^a   Xue, J M ^a   Li, W Z ^a   Wang, J ^a   Zhu, H ^b   Miao, J M ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CHARGE CARRIERS; DIELECTRIC LOSSES; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; GRAIN BOUNDARIES; MAGNETRON SPUTTERING; PEROVSKITE; SODIUM COMPOUNDS; SYNTHESIS (CHEMICAL); TEMPERATURE MEASUREMENT; THIN FILMS;

DC CONDUCTIVITY; MICROPOLAR REGIONS; RADIO-FREQUENCY; ROOM TEMPERATURE;

LEAKAGE CURRENTS;

EID: 14644406244     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/4/019     Document Type: Article

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