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Volumn 6029, Issue , 2006, Pages

Na0.5Bi0.5TiO3-based ferroelectric thin films

Author keywords

Ferroelectric; Na0.5Bi0.5TiO3; Thin films

Indexed keywords

CARRIER CONCENTRATION; ENVIRONMENTAL PROTECTION; HYSTERESIS; PIEZOELECTRIC MATERIALS; POLARIZATION; SODIUM COMPOUNDS; SWITCHING SYSTEMS;

EID: 33645212482     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.667710     Document Type: Conference Paper
Times cited : (1)

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  • 11
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    • 2/Si structure for metal ferroelectric insulator semiconductor field effect transistor
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    • Kim, Y.T.1    Shin, D.S.2
  • 12
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    • MOS conductance technique for measuring surface state parameters
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.