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Volumn 42, Issue 2, 2010, Pages 88-94
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Investigation of rapid thermally annealed GaP(001) surfaces in vacuum
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Author keywords
GaP surface; Rapid thermal annealing; Spectroscopic ellipsometry
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Indexed keywords
DROPLET DENSITY;
EPMA;
EX SITU;
GAP SURFACE;
IN-VACUUM;
INDUCED DEGRADATION;
NATIVE OXIDES;
SURFACE OXIDE;
THERMAL-ANNEALING;
XPS DATA;
XPS SPECTRA;
ACTIVATION ENERGY;
ATOMIC SPECTROSCOPY;
DROP FORMATION;
ELECTRON PROBE MICROANALYSIS;
GALLIUM;
GALLIUM ALLOYS;
OPTICAL DATA STORAGE;
OPTICAL INSTRUMENTS;
OPTICAL MICROSCOPY;
PHOTODEGRADATION;
RAPID THERMAL ANNEALING;
RAPID THERMAL PROCESSING;
SPECTROSCOPIC ELLIPSOMETRY;
SPONTANEOUS EMISSION;
VACUUM;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 76749152400
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.3158 Document Type: Article |
Times cited : (5)
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References (29)
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