Time-dependent electroforming in NiO resistive switching devices

Applied Physics Letters

Volumn 95, Issue 14, 2009, Pages

  Buh, Gyoung Ho ^a,c   Hwang, Inrok ^b   Park, Bae Ho ^b  

^a Korea Research Institute of Chemical Technology   (South Korea)

^b Konkuk University   (South Korea)

^c Korea Intellectual Property Office   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; CRITICAL VOLTAGES; EXPONENTIAL DEPENDENCE; FORMING PARAMETERS; FORMING PROCESS; PULSE MODES; RESISTIVE SWITCHING; SPONTANEOUS PROCESS; STRESS-INDUCED; TIME-DEPENDENT; TIME-DEPENDENT DIELECTRIC BREAKDOWN; TIME-DEPENDENT PROCESS;

ELECTROCHEMISTRY; ELECTROFORMING; ELECTROMETALLURGY;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 70349907463     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3242337     Document Type: Article

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