Characterization of complex thermal barrier deposits pore microstructures by a combination of imaging, scattering, and intrusion techniques

Journal of Thermal Spray Technology

Volumn 19, Issue 1-2, 2010, Pages 178-189

  Ilavsky, J ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Imaging techniques; Intrusion porosimetry; Microstructure characterization; Porosity; Small angle scattering

Indexed keywords

CHARACTERIZATION METHODS; CHARACTERIZATION TECHNIQUES; INTRUSION POROSIMETRY; MICROSTRUCTURE CHARACTERIZATION; NEUTRON IMAGING; POROUS MICROSTRUCTURE; SCANNING ELECTRONS; SCATTERING TECHNIQUES; SCIENTISTS AND ENGINEERS; SIZE RANGES; SMALL-ANGLE SCATTERING; THERMAL BARRIER;

DEPOSITS; IMAGING TECHNIQUES; INDUSTRIAL RESEARCH; SCATTERING;

MICROSTRUCTURE;

EID: 76449105029     PISSN: 10599630     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11666-009-9361-y     Document Type: Conference Paper

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