Digital electron microscopy on advanced materials

Materials Characterization

Volumn 44, Issue 4, 2000, Pages 375-384

  Shindo, D ^a   Ikematsu, Y ^a   Lim, S H ^a   Yonenaga, I ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER ALLOYS; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; SEMICONDUCTING GALLIUM ARSENIDE; STACKING FAULTS;

DIGITAL ELECTRON MICROSCOPY;

ELECTRON MICROSCOPY;

EID: 0034171471     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(00)00073-5     Document Type: Article

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