Application of image analysis for characterization of powders

Materials Science- Poland

Volumn 23, Issue 1, 2005, Pages 79-86

  Michalski, Jakub ^a   Wejrzanowski, Tomasz ^a   Pielaszek, Roman ^b   Konopka, Katarzyna ^a   Łojkowski, Witold ^b   Kurzydłowski, Krzysztof Jan ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

Author keywords

Grain size and shape; Image analysis; Nano crystals; Stereology

Indexed keywords

AGGLOMERATION; CERAMIC MATERIALS; ELECTRON MICROSCOPY; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; MATERIALS SCIENCE; POLYMERS; SINGLE CRYSTALS; SURFACE TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

MULTI-FUNCTIONAL MATERIALS; NANOPOWDERS; SINGLE CRYSTALLITES; STEREOLOGY;

POWDERS;

EID: 17844404817     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (4)

1. PIELASZEK R., Analytical expression for diffraction line profile for polydispersive powders, Appl. Crystallography, Proceedings of the XIX Conference, Kraków, Poland, September 2003, pp. 43-50.
2. PIELASZEK R., J. Alloys Comp. 382 (2004), 128.
3. KURZYDłOWSKI K.J., RALPH B., Quantitave description of the microstructure of materials, CRC Press, Baton Rouge, USA, 1995.
4. WEJRZANOWSKI T., Computer assisted analysis of gradient materials microstructure, Master Thesis, Warsaw University of Technology, 2000.