Recent developments in the characterization of anisotropic void populations in thermal barrier coatings using ultra-small angle x-ray scattering

Ceramic Engineering and Science Proceedings

Volumn 24, Issue 3, 2003, Pages 517-524

  Dobbins, T A ^a   Allen, A J ^a   Ilavsky, J ^a,b   Long, G G ^a   Jemian, P R ^c   Kulkarni, A ^d   Herman, H ^d  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Purdue University   (United States)

^c University of Illinois at Urbana Champaign   (United States)

^d STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; MATHEMATICAL MODELS; PARTICLE SIZE ANALYSIS; PHYSICAL VAPOR DEPOSITION; VECTORS; VOLUME FRACTION; X RAY SCATTERING;

ANISOTROPIC VOID POPULATION; ULTRA SMALL X RAY SCATTERING;

THERMAL BARRIER COATINGS;

EID: 0345328763     PISSN: 01966219     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/9780470294802.ch74     Document Type: Conference Paper

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