Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures

Review of Scientific Instruments

Volumn 73, Issue 3 II, 2002, Pages 1660-

  Ilavsky, J ^a   Allen, A J ^b   Long, G G ^b   Jemian, P R ^c  

^a UNIVERSITY OF MARYLAND   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

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Indexed keywords

EID: 0036494712     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1425387     Document Type: Conference Paper

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