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Volumn 96, Issue 5, 2010, Pages

Thermal stability of organic thin-film transistors with self-assembled monolayer dielectrics

(7) Fukuda, Kenjiro a Yokota, Tomoyuki a Kuribara, Kazunori a Sekitani, Tsuyoshi a Zschieschang, Ute b Klauk, Hagen b Someya, Takao a

a UNIVERSITY OF TOKYO (Japan)

b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING EFFECTS; BIAS STRESS; BULK PHASE; ELECTRONIC PERFORMANCE; IRREVERSIBLE DEGRADATION; LOW-VOLTAGE; ORGANIC THIN FILM TRANSISTORS; PASSIVATION LAYER; PENTACENE CRYSTALS; PENTACENES; STRESS EFFECTS; STRUCTURE CHANGE; THERMAL STABILITY;

ANNEALING; CRYSTAL STRUCTURE; DEGRADATION; DRAIN CURRENT; GATE DIELECTRICS; GATES (TRANSISTOR); PASSIVATION; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTING ORGANIC COMPOUNDS; THERMODYNAMIC STABILITY;

THIN FILM TRANSISTORS;

EID: 76449083116 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3299017 Document Type: Article

Times cited : (50)

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