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Volumn 204, Issue 12-13, 2010, Pages 2081-2084

Molecular dynamics simulations of the sputtering of SiC and Si3N4

Author keywords

Magnetron sputtering; Molecular dynamics simulation; Silicon carbide; Silicon nitride; Sputter yield

Indexed keywords

AR ATOM; LITERATURE DATA; LOW-ENERGY RANGE; MD SIMULATION; MOLECULAR DYNAMICS SIMULATION; MOLECULAR DYNAMICS SIMULATIONS; SPUTTER PROCESS; SPUTTER YIELD; SPUTTER YIELDS; SPUTTERED SPECIES;

EID: 76349125328     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.09.043     Document Type: Article
Times cited : (29)

References (21)
  • 15
    • 76349117774 scopus 로고    scopus 로고
    • PhD Thesis, Auger electron spectroscopy and low-energy ion bombardment of silicon carbide, Technical University of Ilmenau
    • R. Kosiba, PhD Thesis, Auger electron spectroscopy and low-energy ion bombardment of silicon carbide, Technical University of Ilmenau (2005).
    • (2005)
    • Kosiba, R.1
  • 18
    • 76349093706 scopus 로고    scopus 로고
    • IMD home
    • IMD homepage, http://www.itap.physik.uni-stuttgart.de/~imd.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.