An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2009, Pages 497-504

  Kanj, Rouwaida ^a   Joshi, Rajiv ^b   Adams, Chad ^c   Warnock, James ^b   Nassif, Sani ^a  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c IBM   (United States)

Author keywords

Memory repair and test; NBTI; SRAM; Statistical performance; Yield prediction

Indexed keywords

COMPUTER AIDED DESIGN; IMPORTANCE SAMPLING; NEGATIVE BIAS TEMPERATURE INSTABILITY; REPAIR; STATIC RANDOM ACCESS STORAGE; STATISTICS; TESTING;

ASYMMETRICAL DISTRIBUTIONS; BEGINNING OF LIVES; CONDITIONAL IMPORTANCE SAMPLING; MEMORY REPAIR; STATISTICAL APPROACH; STATISTICAL PERFORMANCE; STATISTICAL SIMULATION; YIELD PREDICTION;

SAMPLING;

EID: 76349116489     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1687399.1687494     Document Type: Conference Paper

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