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Volumn 42, Issue 4, 2007, Pages 846-852
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The 65-nm 16-MB shared on-die L3 cache for the Dual-Core Intel Xeon Processor 7100 Series
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Author keywords
Circuit design; Computer architecture; Manufacturability; Microprocessor; On die cache; Power reduction; Reliability; Test
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Indexed keywords
DUAL-CORE INTEL XEON PROCESSOR;
ON-DIE CACHE;
POWER REDUCTION;
BUFFER CIRCUITS;
BUFFER STORAGE;
LEAKAGE CURRENTS;
OPTIMIZATION;
STATIC RANDOM ACCESS STORAGE;
TRANSISTORS;
PROGRAM PROCESSORS;
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EID: 33947644880
PISSN: 00189200
EISSN: None
Source Type: Journal
DOI: 10.1109/JSSC.2007.892185 Document Type: Article |
Times cited : (69)
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References (6)
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