Mechanical and surface topography changes during mechanical testing of diffraction optical elements in polymer

Experimental Techniques

Volumn 34, Issue 1, 2010, Pages 55-62

  Tamulevicius S ^a,b   Augulis, L ^a   Janusas G ^a   Guobiene, A ^b   Puodziukynas L ^a,b   Vanagas, G ^c  

^a KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

^b KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CHARGE-COUPLED DEVICE CAMERA; DIFFRACTION MEASUREMENTS; DIFFRACTION OPTICAL ELEMENT; ELECTRONIC SPECKLE PATTERN INTERFEROMETERS; IN-PLANE DISPLACEMENT; MICROTENSILE TESTING; PIEZOCERAMIC; SPECKLE PATTERNS; TENSILE FORCES;

DENSITY (OPTICAL); DIFFRACTION; DIFFRACTIVE OPTICAL ELEMENTS; MECHANICAL ENGINEERING; POLYETHYLENE TEREPHTHALATES; SPECKLE; SURFACE TESTING; SURFACE TOPOGRAPHY; THERMOPLASTICS;

TENSILE TESTING;

EID: 76349083649     PISSN: 07328818     EISSN: 17471567     Source Type: Journal    
DOI: 10.1111/j.1747-1567.2009.00479.x     Document Type: Article

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