Piezo-Actuated Microtensile Test Apparatus

Journal of Testing and Evaluation

Volumn 26, Issue 3, 1998, Pages 255-259

  Read, David T ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Closed loop; Displacement; Force; Piezoelectric; Servo; Strain; Stress; Thin film

Indexed keywords

CLOSED LOOP CONTROL SYSTEMS; EDDY CURRENTS; FORCE MEASUREMENT; MACHINE DESIGN; PIEZOELECTRIC DEVICES; SENSORS; SERVOMECHANISMS; STRAIN; STRESSES; THIN FILMS;

PIEZO-ACTUATED MICROTENSILE TEST APPARATUS;

TENSILE TESTING;

EID: 0032074545     PISSN: 00903973     EISSN: None     Source Type: Journal    
DOI: 10.1520/jte11999j     Document Type: Article

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