A microtensile set up for characterising the mechanical properties of films

Materials Research Society Symposium Proceedings

Volumn 875, Issue , 2005, Pages 109-114

  Cyziute, B ^a   Augulis, L ^a   Bonneville, J ^b   Goudeau, P ^b   Lamongie, B ^b   Tamulevicius, S ^a   Templier, C ^b  

^a KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

Load relaxation; Mechanical properties; Tensile test; Thin film

Indexed keywords

ALUMINUM; ELASTIC MODULI; ELASTICITY; MECHANICAL PROPERTIES; STRESS ANALYSIS; TENSILE TESTING;

LOAD RELAXATION; OPTICAL IMAGES; STRESS-STRAIN CURVES;

THIN FILMS;

EID: 30644462518     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-875-o4.8     Document Type: Conference Paper

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