Faceting induced by ultrathin metal films: structure, electronic properties and reactivity

Surface Science

Volumn 438, Issue 1-3, 1999, Pages 191-206

  Madey, T E ^a   Nien, C H ^a   Pelhos, K ^a   Kolodziej, J J ^a   Abdelrehim, I M ^a   Tao, H S ^a  

^a State University of New Jersey   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; MOLYBDENUM; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; TUNGSTEN; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

BODY CENTERED CUBIC MOLYBDENUM; BODY CENTERED CUBIC TUNGSTEN; THERMAL DESORPTION SPECTROSCOPY;

METALLIC FILMS;

EID: 0033352850     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00570-1     Document Type: Article

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