Positron annihilation study of the interfacial defects in ZnO nanocrystals: Correlation with ferromagnetism

Journal of Applied Physics

Volumn 107, Issue 2, 2010, Pages

  Wang, Dong ^a   Chen, Z Q ^a   Wang, D D ^a   Qi, N ^a   Gong, J ^a   Cao, C Y ^b   Tang, Z ^b  

^a WUHAN UNIVERSITY   (China)

^b EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; CRYSTAL QUALITIES; GRAIN BOUNDARY REGIONS; GRAIN SIZE; HIGH PURITY; HIGHER TEMPERATURES; INTERFACIAL DEFECT; LATTICE DISORDERS; NANO POWDERS; POSITRON ANNIHILATION MEASUREMENTS; POSITRON TRAPPING; VACANCY CLUSTER; VACANCY DEFECTS; ZNO; ZNO NANOCRYSTAL;

ANNEALING; ELECTRONS; FERROMAGNETISM; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HYSTERESIS; HYSTERESIS LOOPS; METAL ANALYSIS; NANOCRYSTALS; PELLETIZING; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; RADIATION DAMAGE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; VACANCIES; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE;

SURFACE DEFECTS;

EID: 75749101849     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3291134     Document Type: Article

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