Application of negative differential conductance in Al/AlOx single-electron transistors for background charge characterization

Applied Physics Letters

Volumn 96, Issue 4, 2010, Pages

  George, Hubert C ^a   Pierre, Mathieu ^b   Jehl, Xavier ^b   Orlov, Alexei O ^a   Sanquer, Marc ^b   Snider, Gregory L ^a  

^a University of Notre Dame   (United States)

^b CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION BETWEEN EXPERIMENT AND THEORY; ELECTROSTATIC MODELS; METAL OXIDES; NEGATIVE DIFFERENTIAL CONDUCTANCE; NORMAL STATE; QUARTZ SUBSTRATE; ROOM TEMPERATURE; TRAP CHARGING;

METALLIC COMPOUNDS; OXIDE MINERALS; QUARTZ; SEMICONDUCTOR QUANTUM DOTS; TRANSIENTS;

SINGLE ELECTRON TRANSISTORS;

EID: 75749084519     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3298557     Document Type: Article

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