Multi-length and time scale thermal transport using the lattice Boltzmann method with application to electronics cooling

International Journal of Heat and Mass Transfer

Volumn 49, Issue 1-2, 2006, Pages 97-107

  Escobar, Rodrigo A ^a,b   Ghai, Sartaj S ^a   Jhon, Myung S ^a   Amon, Cristina H ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

Author keywords

Electronics cooling; Hotspots; Lattice Boltzmann method; Nanoscale heat transfer; Silicon on insulator transistor

Indexed keywords

COOLING; CRYSTALLINE MATERIALS; HEAT CONDUCTION; SILICON ON INSULATOR TECHNOLOGY; THERMAL EFFECTS; TRANSISTORS;

ELECTRONICS COOLING; HOTSPOTS; LATTICE BOLTZMANN METHOD; NANOSCALE HEAT TRANSFER;

HEAT TRANSFER;

CRYSTALLINE MATERIALS; HEAT CONDUCTION; HEAT TRANSFER; SILICON ON INSULATOR TECHNOLOGY; THERMAL EFFECTS; TRANSISTORS;

EID: 32144433579     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijheatmasstransfer.2005.08.003     Document Type: Article

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