Anisotropic dielectric properties in epitaxial Bi 3.25La 0.75Ti 3O 12 thin films along different crystal directions

Applied Physics Letters

Volumn 85, Issue 13, 2004, Pages 2586-2588

  Lee, Jang Sik ^a   Kang, B S ^a   Lin, Y ^a   Li, Y ^a   Jia, Q X ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPLANAR CAPACITORS; DIELECTRIC NONLINEARITY; ORTHORHOMBICITY; SPONTANEOUS POLARIZATION;

ANISOTROPY; BISMUTH COMPOUNDS; CAPACITORS; CRYSTAL ORIENTATION; DIELECTRIC LOSSES; ELECTRIC FIELDS; EPITAXIAL GROWTH; EXCIMER LASERS; FILM GROWTH; LATTICE CONSTANTS; MIM DEVICES; PERMITTIVITY; PEROVSKITE; PULSED LASER DEPOSITION; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 7544247826     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1797536     Document Type: Article

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