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Volumn 42, Issue SUPPL., 2003, Pages

Mechanisms of hydrogen-induced degradation in ferroelectric thin films for ferroelectric random access memory applications

Author keywords

Decomposition; Defects; Ferroelectric; Forming gas; Hydrogen; Memory

Indexed keywords


EID: 7544222584     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (16)
  • 1
    • 0033262914 scopus 로고    scopus 로고
    • Sung-Yung Lee, Bon-Jae Koo, Dong-Jin Jung and Kinam Kim, J. Korean Phys. Soc. 35, S783 (1999). J. Im, O. Auciello, A. R. Krauss, D. M. Gruen, R. P. H. Chang, S. H. Kim and A. I. Kingon, Appl. Phys. Lett. 74, 1162 (1998).
    • (1999) J. Korean Phys. Soc. , vol.35
    • Lee, S.-Y.1    Koo, B.-J.2    Jung, D.-J.3    Kim, K.4
  • 11
    • 30244536335 scopus 로고    scopus 로고
    • Ph. D. thesis
    • S. Seo, Ph. D. thesis, 2002.
    • (2002)
    • Seo, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.