Degradation of ferroelectric capacitors during forming gas annealing

Journal of the Korean Physical Society

Volumn 40, Issue 4, 2002, Pages 729-732

  Koo, June Mo ^a   Park, Noh Heon ^a   Park, Juwhan ^a   Lee, Won Hee ^a   Lee, Jae Gab ^a   Kim, Jiyoung ^a  

^a Kookmin University   (South Korea)

Author keywords

Ferroelectrics; Hydrogen; Lattice parameter; XPS

Indexed keywords

EID: 0036011367     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.40.729     Document Type: Conference Paper

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