Nanoscale investigation of hydrogen-induced degradation mechanism in Pt/(Pb, La)(Zr, Ti)O3/Pt capacitors

Applied Physics Letters

Volumn 79, Issue 9, 2001, Pages 1339-1341

  Yoshida, Chikako ^a   Tamura, Tetsuro ^a   Kondo, Kazuaki ^a   Takasaki, Kanetake ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040752619     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1398317     Document Type: Article

References (15)

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15. To separate the displacement signal from noise, a modulated ac voltage is applied to the capacitor. The voltage profile (0→5→-5→0 V) consists of successive steps separated by intervals of the same duration (25 ms).