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Volumn 76-78, Issue , 2009, Pages 497-501

Fabrication of carbon nanotube probes in atomic force microscopy

Author keywords

Atomic force microscopy; Focused ion beam; Metrology; Nanotube

Indexed keywords

BONDING FORCES; CARBON NANOTUBE PROBES; FOCUSED ION BEAM MILLING; IMAGING RESOLUTIONS; METROLOGY; NANOTUBE PROBES; PT DEPOSITION;

EID: 73949151508     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMR.76-78.497     Document Type: Conference Paper
Times cited : (4)

References (11)
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  • 5
    • 34250190994 scopus 로고    scopus 로고
    • High Aspect Ratio Nanometrology using Carbon Nanotube Probes in Atomic Force Microscopy
    • DOI 10.1016/j.cirp.2007.05.127, PII S000785060700128X
    • F.Z. Fang, Z.W. Xu, S. Dong, et al: Annals of the CIRP Vol.56 (2007), p.533 doi:10.1016/j.cirp.2007.05.127 (Pubitemid 46898355)
    • (2007) CIRP Annals - Manufacturing Technology , vol.56 , Issue.1 , pp. 533-536
    • Fang, F.Z.1    Xu, Z.W.2    Dong, S.3    Zhang, G.X.4
  • 9
    • 26644457896 scopus 로고    scopus 로고
    • Imaging artefacts in atomic force microscopy with carbon nanotube tips
    • DOI 10.1088/0957-4484/16/11/003, PII S0957448405021586
    • M.C. Strus, A. Raman, C.S. Han, et al: Nanotechnology Vol.16 (2005), p.2482 doi:10.1088/0957-4484/16/11/003 (Pubitemid 41439676)
    • (2005) Nanotechnology , vol.16 , Issue.11 , pp. 2482-2492
    • Strus, M.C.1    Raman, A.2    Han, C.-S.3    Nguyen, C.V.4
  • 10
    • 42549164974 scopus 로고    scopus 로고
    • Study on phase images of a carbon nanotube probe in atomic force microscopy
    • DOI 10.1088/0957-0233/19/5/055501, PII S095702330860168X
    • F.Z. Fang, Z.W. Xu, S. Dong: Meas. Sci. Tech. Vol.19 (2008), p.055501 doi:10.1088/0957-0233/19/5/055501 (Pubitemid 351591227)
    • (2008) Measurement Science and Technology , vol.19 , Issue.5 , pp. 055501
    • Fang, F.Z.1    Xu, Z.W.2    Dong, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.