Pinch-off maps for the design of morphologically stable multilayer thin films with immiscible phases

Acta Materialia

Volumn 53, Issue 19, 2005, Pages 5089-5099

  Wang, Jue ^a   Anderson, Peter M ^a  

^a The Ohio State University   (United States)

Author keywords

Creep; Interface migration; Multilayer thin films

Indexed keywords

ASPECT RATIO; CREEP; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MORPHOLOGY; MULTILAYERS; NANOSTRUCTURED MATERIALS; REACTION KINETICS; STRAIN RATE;

INTERFACE MIGRATION; INTERFACIAL DIFFUSIVITIES; MULTILAYER THIN FILMS; NANO-SCALE FILMS;

THIN FILMS;

EID: 26644460643     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.07.020     Document Type: Article

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