A 1.8 V 1.0 GS/s 10b self-calibrating unified-folding-interpolating ADC With 9.1 ENOB at nyquist frequency

IEEE Journal of Solid-State Circuits

Volumn 44, Issue 12, 2009, Pages 3294-3304

  Taft, Robert C ^a   Francese, Pier Andrea ^a   Tursi, Maria Rosaria ^a   Hidri, Ols ^a   MacKenzie, Alan ^b   Höhn, Tobias ^a   Schmitz, Philipp ^a   Werker, Heinz ^a   Glenny, Andrew ^c  

^a National Semiconductor   (Germany)

^b National Semiconductor (UK) Ltd   (United Kingdom)

^c NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

Analog to digital conversion; Calibration; CMOS analog integrated circuits; Folding; High speed techniques; Interpolation; Nyquist converter; Pipelined

Indexed keywords

ANALOG TO DIGITAL CONVERTERS; CMOS ANALOG INTEGRATED CIRCUITS; DUAL CHANNEL; FOLDING; HIGH-SPEED TECHNIQUES; HIGHER RESOLUTION; INTERPOLATING ADC; NYQUIST; NYQUIST CONVERTERS; NYQUIST FREQUENCY; POWER CONSUMPTION; SELF-CALIBRATING;

ANALOG TO DIGITAL CONVERSION; CALIBRATION; CMOS INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUITS; INTERPOLATION; LINEAR INTEGRATED CIRCUITS; MULTICARRIER MODULATION; TIME VARYING SYSTEMS;

ANALOG CIRCUITS;

EID: 72949112080     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2009.2032634     Document Type: Conference Paper

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