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Volumn 42, Issue 24, 2009, Pages
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Structural and optical properties of SnS semiconductor films produced by chemical bath deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC RATIO;
CHEMICAL BATH DEPOSITION TECHNIQUE;
CHEMICAL-BATH DEPOSITION;
CYLINDRICAL ROD;
DIELECTRIC CONSTANTS;
ENVELOPE METHOD;
EXTINCTION COEFFICIENTS;
LATTICE PARAMETERS;
OPTICAL PARAMETER;
PLASMA FREQUENCIES;
POLYCRYSTALLINE;
REFLECTANCE MEASUREMENTS;
ROOM TEMPERATURE;
SEMICONDUCTOR FILMS;
SNS FILMS;
STRUCTURAL AND OPTICAL PROPERTIES;
TRANSMITTANCE SPECTRA;
CARRIER CONCENTRATION;
CRYSTALLITE SIZE;
PLASMA WAVES;
REFRACTIVE INDEX;
TIN;
OPTICAL FILMS;
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EID: 72649093924
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/24/245408 Document Type: Article |
Times cited : (82)
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References (39)
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