Spray pyrolytic deposition and characterization of SnS and SnS2 thin films

Journal of Physics D: Applied Physics

Volumn 33, Issue 9, 2000, Pages 1054-1059

  Thangaraju, B ^a,b   Kaliannan, P ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b BHARATHIDASAN UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; DEPOSITION; DOPING (ADDITIVES); FILM PREPARATION; FLUORINE; GLASS; GRAIN SIZE AND SHAPE; PHOTOCONDUCTIVITY; POLYCRYSTALLINE MATERIALS; PYROLYSIS; SEMICONDUCTING TIN COMPOUNDS; THIN FILMS;

DARK CONDUCTIVITY; SPRAY PYROLYSIS;

SEMICONDUCTING FILMS;

EID: 0033748660     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/9/304     Document Type: Article

References (43)

1. Engelken R D, McCloud H E, Lee C, Slayton M and Ghoreishi H 1987 J. Electrochem. Soc. 134 2696
2. Noguchi H, Setizadi A, Tanamura H, Nagatomo T and Omoto O 1994 Solar Energy Mater. Solar Cells 35 325
3. Ristov M, Sinadinovski G, Grozdanov I and Mitreski M 1989 Thin Solid Films 173 53
4. Rao M, Acharya S, Samuel A M and Srivastava O N 1986 Bull. Mineral 109 469
5. Nair M T S and Nair P K 1991 Semicond. Sci. Technol. 6 132
6. Sharon M and Basavaswaran K 1988 Solar Cells 25 97
7. Lokhande C D 1990 J. Phys. D: Appl. Phys. 23 1703
8. Greenaway D L and Nitsche R 1965 J. Phys. Chem. Solids 26 1445
9. Lee P A, Said G, Davis R and Lim T H 1969 J. Phys. Chem. Solids 30 2719
10. Acharya S and Srivastava O N 1979 Phys. Status Solidi a 56 K1
11. Schafer H 1964 Chemical Transport Reactions (New York: Academic)
12. Domingo G, Itoga R S and Kannewurf C R 1996 Phys. Rev. 143 536
13. Patil S G and Tredgold R H 1971 J. Phys. D: Appl. Phys. 4 718
14. Nakata R, Yamaguchi M, Zembutsu S and Sumita M 1972 J. Phys. Soc. Japan 32 1153
15. Said G and Lee P A 1973 Phys. Status Solidi a 15 99
16. Mead D G and Irwin J C 1976 Solid State Commun. 20 885
17. Shephard J H and Williams P M 1974 J. Phys. C: Solid State Phys. 7 4416
18. Powell M J 1977 J. Phys. C: Solid State Phys. 10 2967
19. Au-Yang M Y and Cohen M L 1969 Phys. Rev. 178 1279
20. George J and Joseph K S 1982 J. Phys. D: Appl. Phys. 15 1109
21. Matsumoto K and Kaneko S 1984 Thin Solid Films 121 227
22. Abass A K, Jassim H A, Majeid K J and Misho R H 1985 Phys. Status Solidi a 91 129
23. Abass A K, Majeid K J, Jassim H A and Murad W A 1986 Solid State Commun. 57 805
24. Pramanik P, Basu P K and Biswas S 1987 Thin Solid Films 150 269
25. Reddy N K and Reddy K T R 1998 Thin Solid Films 325 4
26. Rao M, Acharya S, Samuel A M and Srivastava O N 1986 Bull. Mineral 109 469
27. Thangaraju B and Kaliannan P 2000 Cryst. Res. Technol. 35 71
28. Gordillo G, Moreno L C, de la Cruz W and Teheran P 1994 Thin Solid Films 252 61
29. Chopra K L, Major S and Pandya D K 1983 Thin Solid Films 102 1
30. Ferekides C, Britt J, Ma Y and Kilian L 1993 23rd IEEE Photon Spectroscopy Conf. (Luisville) (New York: Institute of Electrical and Electronic Engineers) p 389
31. Thangaraju B and Kaliannan P 2000 Semicond. Sci. Technol. 15 at press
32. Marodiev G, Gajdardziska M and Novkovski N 1984 Thin Solid Films 113 93
33. CRC Hand Book of Chemistry and Physics 1993-1994 74th edn, ed D R Linde (Boca Raton, FL: CRC Press) pp 4-108
34. X-ray powder diffraction file JCPDS File reference number 21-1231
35. X-ray powder diffraction file JCPDS File reference number 5-0467
36. Klug P H and Alexander L E 1954 X-ray Diffraction Procedures (New York: Wiley)
37. Orton J W, Goldsmith B J, Chapman J A and Powell M J 1982 J. Appl. Phys. 53 1602
38. Kazmerski L L 1980 Polycrystalline and Amorphous Thin Films and Devices (New York: Academic) p 59
39. Pankove J I 1971 Optical Processes in Semiconductors (Englewood Cliffs, NJ: Prentice-Hall) ch 4
40. Connell G A N and Lewis A 1973 Phys. Status Solidi b 60 291
41. Mishra K, Rajeshwar K, Weiss A, Murley M, Engelken R D, Slayton M and McCloud H E 1989 J. Electrochem. Soc. 136 1915
42. Parenteau M and Carlone C 1990 Phys. Rev. B 41 5227
43. Bardeen J, Blatt F J and Hall L H 1956 Photoconductivity Conference ed R Breckenridge, B Russell and E Hahn (New York: Wiley) p 146