Determination of the optical properties of non-uniformly thick non-hydrogenated sputtered silicon thin films on glass

Thin Solid Films

Volumn 460, Issue 1-2, 2004, Pages 247-255

  Richards, B S ^a   Lambertz, A ^b   Sproul, A B ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Optical properties; Silicon; Solar cells; Sputtering

Indexed keywords

AMORPHOUS SILICON; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ENERGY GAP; GLASS; INFRARED RADIATION; LIGHT ABSORPTION; RAMAN SCATTERING; SPUTTERING;

ABSORPTION COEFFICIENTS; BAND GAPS; DEFECT LEVELS; SOLID PHASE CRYSTALLIZATION (SPC);

THIN FILMS;

EID: 2942625875     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.072     Document Type: Article

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