Synthesis and characterization of tin sulphide thin films grown by chemical bath deposition technique

Journal of Alloys and Compounds

Volumn 463, Issue 1-2, 2008, Pages 581-584

  Hankare, P P ^a   Jadhav, A V ^a   Chate, P A ^a   Rathod, K C ^a   Chavan, P A ^a   Ingole, S A ^b  

^a SHIVAJI UNIVERSITY   (India)

^b Siddharth College of Arts   (India)

Author keywords

Chemical deposition; Scanning electron microscopy; Semiconductors; Thin films

Indexed keywords

ABSORPTION; ACTIVATION ENERGY; CHEMICAL ACTIVATION; COLOR FILMS; CONDUCTIVE FILMS; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPES; FILMS; OPTICAL CONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; SOLIDS; SYNTHESIS (CHEMICAL); THICK FILMS; THIN FILMS; TIN; TITANIUM COMPOUNDS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS; X RAY FILMS;

BAND GAPS; CHEMICAL BATH DEPOSITION TECHNIQUE; CHEMICAL BATHS; CHEMICAL ROUTES; ELECTRICAL CONDUCTIVITY MEASUREMENTS; ELSEVIER (CO); GLASS SUBSTRATES; OPTICAL (PET) (OPET); OPTICAL ABSORPTION (OA); P TYPE CONDUCTIVITIES; ROOM-TEMPERATURE (RT); SCANNING ELECTRON MICROSCOPE (SEM); SOURCE MATERIALS; STANNOUS CHLORIDE; SYNTHESIS AND CHARACTERIZATION; TIN SULPHIDE; X RAY DIFFRACTION (XRD);

OPTICAL FILMS;

EID: 48949118574     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.11.065     Document Type: Article

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