Investigation of optical parameters of Ag-In-Se thin films deposited by e-beam technique

Journal of Non-Crystalline Solids

Volumn 354, Issue 30, 2008, Pages 3630-3636

  Colakoglu T ^a   Parlak, M ^a   Ozder S ^b  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

^b ÇANAKKALE ONSEKIZ MART UNIVERSITY   (Turkey)

Author keywords

Absorption; Dielectric constant; Optical properties; Refractive index; Ternary semiconductor; Thin films

Indexed keywords

DEPOSITION; PERMITTIVITY; REFRACTIVE INDEX; SILVER COMPOUNDS;

E-BEAM TECHNIQUE; TERNARY SEMICONDUCTORS;

THIN FILMS;

EID: 44949161882     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.03.014     Document Type: Article

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