ToF-SIMS study of gold/phthalocyanine interface

Applied Surface Science

Volumn 256, Issue 6, 2010, Pages 1946-1950

  Pakhomov, Georgij L ^a   Drozdov, Mikhail N ^a   Travkin, Vlad V ^b  

^a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^b LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

Author keywords

Interface; Molecular electronics; Phthalocyanine; SIMS; Thin films

Indexed keywords

DEPOSITION; DEPTH PROFILING; FREE FLIGHT; GOLD DEPOSITS; MOLECULAR ELECTRONICS; ORGANIC POLYMERS; SECONDARY ION MASS SPECTROMETRY; THERMAL EVAPORATION; THIN FILMS;

CONTACT PHENOMENA; DEPOSITION METHODS; METAL-FREE PHTHALOCYANINE; MUTUAL DIFFUSION; ORGANIC INTERFACES; PHTHALOCYANINE; STRUCTURAL FEATURE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

INTERFACES (MATERIALS);

EID: 72549101346     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.10.042     Document Type: Article

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