Formation of sharp metal-organic semiconductor interfaces: Ag and Sn on CuPc

European Physical Journal B

Volumn 57, Issue 4, 2007, Pages 379-384

  Aristov, V Yu ^a,b   Molodtsova, O V ^a   Zhilin, V M ^b   Ossipyan, Yu A ^b   Vyalikh, D V ^c   Doyle, B P ^d   Nannarone, S ^d,e   Knupfer, M ^a  

^a IFW DRESDEN   (Germany)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^d LABORATORIO TASC   (Italy)

^e UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER PHTHALOCYANINE (CUPC); INTERFACE REACTIONS; ORGANIC DEVICES; SHARP METALORGANIC SEMICONDUCTOR INTERFACES;

ELECTRONIC STRUCTURE; SEMICONDUCTOR MATERIALS; SILVER COMPOUNDS; SYNCHROTRON RADIATION; THIN FILMS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 34547152653     PISSN: 14346028     EISSN: 14346036     Source Type: Journal    
DOI: 10.1140/epjb/e2007-00192-5     Document Type: Article

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