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Volumn 42, Issue 24, 2009, Pages
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Metalorganic chemical vapour deposition of GaN layers on ZnO substrates using α-Al2O3 as a transition layer
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Author keywords
[No Author keywords available]
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Indexed keywords
ETCH PITS;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
FILM PEELING;
GAN LAYERS;
GROWTH OF GAN;
HIGH RESOLUTION X RAY DIFFRACTION;
METALORGANIC CHEMICAL VAPOUR DEPOSITION;
MIRROR-LIKE SURFACE;
MOCVD;
NEAR BAND EDGE EMISSIONS;
NITROGEN SOURCES;
OPTIMAL ANNEALING;
OXYGEN INCORPORATION;
POLYCRYSTALLINE;
POST ANNEALING;
RED SHIFT;
ROOM-TEMPERATURE PHOTOLUMINESCENCE;
SHALLOW DONORS;
SYSTEMATIC STUDY;
TRANSITION LAYERS;
WURTZITE GAN;
ZNO;
ZNO SUBSTRATE;
ALUMINUM;
AMORPHOUS MATERIALS;
ATOMIC LAYER DEPOSITION;
CHEMICAL VAPOR DEPOSITION;
GALLIUM NITRIDE;
LEAKAGE (FLUID);
OXYGEN;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM;
SEMICONDUCTING ZINC COMPOUNDS;
SUBSTRATES;
ZINC;
ZINC OXIDE;
ZINC SULFIDE;
GALLIUM ALLOYS;
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EID: 72449177062
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/24/245302 Document Type: Article |
Times cited : (6)
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References (16)
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