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Volumn 11, Issue 11, 2009, Pages

Imaging of cell-to-material interfaces by SEM after in situ focused ion beam milling on flat surfaces and complex 3D-fibrous structures

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT VISUALIZATION; FIBROUS STRUCTURES; FLAT SURFACES; FOCUSED ION BEAM MILLING; IMPLANT INTERFACES; IN-SITU; MATERIAL CHARACTERIZATIONS; MATERIAL INTERFACES; REGIONS OF INTEREST; SEM; SERIAL SECTIONING; SUB-CELLULAR;

EID: 72449138694     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200900080     Document Type: Article
Times cited : (12)

References (42)
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    • J. Wang, Talanta 2008, 75, 636.
    • (2008) Talanta , vol.75 , pp. 636
    • Wang, J.1
  • 9
    • 72449199470 scopus 로고    scopus 로고
    • Oct. 22
    • Epub 2007, Oct. 22, 2008, 75, 636.
    • (2008) Epub 2007 , vol.75 , pp. 636
  • 22
    • 33644922253 scopus 로고    scopus 로고
    • A. A. Tseng, Small 2005, 1, 924.
    • (2005) Small , vol.1 , pp. 924
    • Tseng, A.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.