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Volumn 42, Issue 4, 2005, Pages 161-171
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Electron microscopy on FIB prepared interfaces of biological and technical materials: First results;Elektronenmikroskopische Untersuchungen an mit FIB-Präparation hergestellten Grenzflächen von biologischen Materialien und Werk-stoffen: erste Ergebnisse
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Author keywords
[No Author keywords available]
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Indexed keywords
BIOTECHNOLOGY;
CELLS;
ELECTRON MICROSCOPY;
ION BEAMS;
MICROMETERS;
MICROPROCESSOR CHIPS;
OPTICAL RESOLVING POWER;
SCANNING ELECTRON MICROSCOPY;
BIOLOGICAL SYSTEMS;
FOCUSED ION BEAMS (FIB);
TECHNICAL SURFACES;
ULTRA STRUCTURE;
INTERFACES (MATERIALS);
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EID: 17444425306
PISSN: 0032678X
EISSN: None
Source Type: Journal
DOI: 10.3139/147.100256 Document Type: Article |
Times cited : (8)
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References (7)
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