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Volumn 42, Issue 4, 2005, Pages 161-171

Electron microscopy on FIB prepared interfaces of biological and technical materials: First results;Elektronenmikroskopische Untersuchungen an mit FIB-Präparation hergestellten Grenzflächen von biologischen Materialien und Werk-stoffen: erste Ergebnisse

Author keywords

[No Author keywords available]

Indexed keywords

BIOTECHNOLOGY; CELLS; ELECTRON MICROSCOPY; ION BEAMS; MICROMETERS; MICROPROCESSOR CHIPS; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY;

EID: 17444425306     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: 10.3139/147.100256     Document Type: Article
Times cited : (8)

References (7)
  • 6
    • 17444424411 scopus 로고    scopus 로고
    • Zrenner, E.: Science 295, (2002), 917
    • (2002) Science , vol.295 , pp. 917
    • Zrenner, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.