메뉴 건너뛰기




Volumn 106, Issue 11, 2009, Pages

Carrier recombination processes in In-polar n-InN in regions of low residual electron density

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER RECOMBINATION; DISLOCATION DENSITIES; INN FILMS; MODEL FUNCTIONS; NO ACTIVATION; NON-RADIATIVE; PHOTOEXCITED HOLES; PHOTOLUMINESCENCE SPECTRUM; PL INTENSITY; RATE EQUATIONS; RESIDUAL ELECTRON DENSITIES; ROCKING CURVES; TEMPERATURE RANGE; THERMALLY ACTIVATED; THREADING DISLOCATION;

EID: 72449132844     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3264718     Document Type: Article
Times cited : (10)

References (23)
  • 4
    • 34247269231 scopus 로고    scopus 로고
    • Threading dislocations in In-polar InN films and their effects on surface morphology and electrical properties
    • DOI 10.1063/1.2720717
    • X. Wang, S. B. Che, Y. Ishitani, and A. Yoshikawa, Appl. Phys. Lett. 0003-6951 90, 151901 (2007). 10.1063/1.2720717 (Pubitemid 46609824)
    • (2007) Applied Physics Letters , vol.90 , Issue.15 , pp. 151901
    • Wang, X.1    Che, S.-B.2    Ishitani, Y.3    Yoshikawa, A.4
  • 19
    • 8444242118 scopus 로고
    • 0163-1829,. 10.1103/PhysRevB.15.989
    • C. H. Henry and D. V. Lang, Phys. Rev. B 0163-1829 15, 989 (1977). 10.1103/PhysRevB.15.989
    • (1977) Phys. Rev. B , vol.15 , pp. 989
    • Henry, C.H.1    Lang, D.V.2
  • 20
    • 4243447390 scopus 로고
    • 0031-9007,. 10.1103/PhysRevLett.47.1333
    • H. Sumi, Phys. Rev. Lett. 0031-9007 47, 1333 (1981). 10.1103/PhysRevLett. 47.1333
    • (1981) Phys. Rev. Lett. , vol.47 , pp. 1333
    • Sumi, H.1
  • 22
    • 13744253600 scopus 로고    scopus 로고
    • Vacancy-type defects in Si-doped InN grown by plasma-assisted molecular-beam epitaxy probed using monoenergetic positron beams
    • DOI 10.1063/1.1845575, 043514
    • A. Uedono, S. F. Chichibu, M. Higashiwaki, T. Matsui, T. Ohdaira, and R. Suzuki, J. Appl. Phys. 0021-8979 97, 043514 (2005). 10.1063/1.1845575 (Pubitemid 40238268)
    • (2005) Journal of Applied Physics , vol.97 , Issue.4 , pp. 0435141-0435145
    • Uedono, A.1    Chichibu, S.F.2    Higashiwaki, M.3    Matsui, T.4    Ohdaira, T.5    Suzuki, R.6
  • 23
    • 65749083519 scopus 로고    scopus 로고
    • 0022-0248,. 10.1016/j.jcrysgro.2009.01.019
    • Y. Takei and T. Nakayama, J. Cryst. Growth 0022-0248 311, 2757 (2009). 10.1016/j.jcrysgro.2009.01.019
    • (2009) J. Cryst. Growth , vol.311 , pp. 2757
    • Takei, Y.1    Nakayama, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.