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Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

Non-Contact Atomic Force Microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip

(5) Hosoi, H a Kimura, M a Hayakawa, K b Sueoka, K a,c Mukasa, K a,c

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

b Hokkaido Foundation for Promotion of Scientific and Industrial Technology (Hokscitec Foundation) (Japan)

c HOKKAIDO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24444454199 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100722 Document Type: Article

Times cited : (17)

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