Significance of strike model in circuit-level prediction of charge sharing upsets

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3109-3114

  Francis, A Matt ^a   Dimitrov, Dimitre ^b   Kauppila, Jeff ^c   Sternberg, Andrew ^c   Alles, Michael ^c   Holmes, James ^a   Mantooth, H A ^d  

^a Lynguent Inc   (United States)

^b BAE SYSTEMS   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d UNIVERSITY OF ARKANSAS   (United States)

Author keywords

Charge sharing; Radiation hardening by design (RHBD); Radiation hardness assurance methodology; Single event effects; Single event transients (SETs)

Indexed keywords

CHARGE SHARING; RADIATION HARDENING BY DESIGN; RADIATION HARDNESS ASSURANCE METHODOLOGY; SINGLE EVENT EFFECTS; SINGLE EVENT TRANSIENTS;

COMPUTER AIDED DESIGN; HARDENING; HARDNESS; RADIATION EFFECTS; RADIATION HARDENING; SIMULATORS;

TRANSIENTS;

EID: 72349083352     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2032912     Document Type: Conference Paper

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