메뉴 건너뛰기




Volumn 20, Issue 12, 2009, Pages

Measurement of air-refractive-index fluctuation from laser frequency shift with uncertainty of order 10-9

Author keywords

Air refractive index; External cavity laser diode; Fabry Perot cavity; Frequency shift; Pound Drever Hall method

Indexed keywords

A-THERMAL; AIR REFRACTIVE INDEX; EXTERNAL CAVITY LASER DIODE; FABRY-PEROT CAVITY; FREQUENCY SHIFT; HOMODYNE INTERFEROMETERS; IMPROVEMENT METHODS; LASER FREQUENCY; MEASUREMENT UNCERTAINTY; POUND-DREVER-HALL;

EID: 72149123666     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/12/125302     Document Type: Article
Times cited : (30)

References (24)
  • 1
    • 70350697523 scopus 로고    scopus 로고
    • Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diode
    • Ishige M, Aketagawa M, Banh Q T and Hoshino Y 2009 Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diode Meas. Sci. Technol. 20 084019
    • (2009) Meas. Sci. Technol. , vol.20 , Issue.8 , pp. 084019
    • Ishige, M.1    Aketagawa, M.2    Banh, Q.T.3    Hoshino, Y.4
  • 2
    • 0026850757 scopus 로고
    • Phase modulation in high-resolution optical interferometry
    • Basile G, Bergamin A, Cavagnero G and Mana G 1991 Phase modulation in high-resolution optical interferometry Metrologia 28 455
    • (1991) Metrologia , vol.28 , Issue.6 , pp. 455
    • Basile, G.1    Bergamin, A.2    Cavagnero, G.3    Mana, G.4
  • 6
    • 0010475192 scopus 로고
    • Real time displacement measurement in sinusoidal phase modulating interferometry
    • Suzuki T, Sasaki O, Higuchi K and Maruyama T 1989 Real time displacement measurement in sinusoidal phase modulating interferometry Appl. Opt. 28 5270
    • (1989) Appl. Opt. , vol.28 , Issue.24 , pp. 5270
    • Suzuki, T.1    Sasaki, O.2    Higuchi, K.3    Maruyama, T.4
  • 7
    • 0034274719 scopus 로고    scopus 로고
    • A nanometric displacement measurement method using the detection of fringe peak movement
    • Yi J H, Kim S H and Kwak Y K 2000 A nanometric displacement measurement method using the detection of fringe peak movement Meas. Sci. Technol. 11 1352
    • (2000) Meas. Sci. Technol. , vol.11 , Issue.9 , pp. 1352
    • Yi, J.H.1    Kim, S.H.2    Kwak, Y.K.3
  • 8
    • 42549087098 scopus 로고    scopus 로고
    • Optical heterodyne laser encoder with sub-nanometer resolution
    • Wu C C, Hsu C C, Lee J Y, Chen H Y and Dai C L 2008 Optical heterodyne laser encoder with sub-nanometer resolution Meas. Sci. Technol. 19 045305
    • (2008) Meas. Sci. Technol. , vol.19 , Issue.4 , pp. 045305
    • Wu, C.C.1    Hsu, C.C.2    Lee, J.Y.3    Chen, H.Y.4    Dai, C.L.5
  • 9
    • 36248984190 scopus 로고    scopus 로고
    • A 2D nano-positioning system with sub-nanometric repeatability over the millimeter displacement range
    • Chassagne L, Wakim M, Xu S, Top S, Ruaux P, Juncar P and Alayli Y 2007 A 2D nano-positioning system with sub-nanometric repeatability over the millimeter displacement range Meas. Sci. Technol. 18 3267
    • (2007) Meas. Sci. Technol. , vol.18 , Issue.11 , pp. 3267
    • Chassagne, L.1    Wakim, M.2    Xu, S.3    Top, S.4    Ruaux, P.5    Juncar, P.6    Alayli, Y.7
  • 10
    • 0009135522 scopus 로고
    • Laser interferometric system for displacement measurement with high precision
    • Hosoe S 1991 Laser interferometric system for displacement measurement with high precision Nanotechnology 2 88
    • (1991) Nanotechnology , vol.2 , Issue.2 , pp. 88
    • Hosoe, S.1
  • 11
    • 34250737781 scopus 로고    scopus 로고
    • Small displacement measurements with subatomic resolution by beat frequency measurements
    • Cip O, Petru F, Buchta Z and Lazar J 2007 Small displacement measurements with subatomic resolution by beat frequency measurements Meas. Sci. Technol. 18 2005
    • (2007) Meas. Sci. Technol. , vol.18 , Issue.7 , pp. 2005
    • Cip, O.1    Petru, F.2    Buchta, Z.3    Lazar, J.4
  • 12
    • 40649128735 scopus 로고    scopus 로고
    • Reflection type heterodyne grating interferometry for in-plane displacement measurement
    • Hsu C C, Wu C C, Lee J Y, Chen H Y and Weng H F 2008 Reflection type heterodyne grating interferometry for in-plane displacement measurement Opt. Commun. 281 2582
    • (2008) Opt. Commun. , vol.281 , Issue.9 , pp. 2582
    • Hsu, C.C.1    Wu, C.C.2    Lee, J.Y.3    Chen, H.Y.4    Weng, H.F.5
  • 13
    • 29744447275 scopus 로고    scopus 로고
    • Analysis of optical interferometric displacement detection in nanoelectromechanical systems
    • Karabacak D, Kouh T and Ekinci K L 2005 Analysis of optical interferometric displacement detection in nanoelectromechanical systems J. Appl. Phys. 98 124309
    • (2005) J. Appl. Phys. , vol.98 , Issue.12 , pp. 124309
    • Karabacak, D.1    Kouh, T.2    Ekinci, K.L.3
  • 14
    • 34247115652 scopus 로고    scopus 로고
    • Surface strain measurement: A comparison of speckle shearing interferometry and optical fibre Bragg gratings with resistance foil strain gauges
    • Groves R M, Chehura E, Li W, Staines S E, James S W and Tatam R P 2007 Surface strain measurement: a comparison of speckle shearing interferometry and optical fibre Bragg gratings with resistance foil strain gauges Meas. Sci. Technol. 18 1175
    • (2007) Meas. Sci. Technol. , vol.18 , Issue.5 , pp. 1175
    • Groves, R.M.1    Chehura, E.2    Li, W.3    Staines, S.E.4    James, S.W.5    Tatam, R.P.6
  • 15
    • 33645225918 scopus 로고    scopus 로고
    • Application of an optical interferometer for measuring the surface contour of micro-components
    • Wang S H and Tay C J 2006 Application of an optical interferometer for measuring the surface contour of micro-components Meas. Sci. Technol. 17 617
    • (2006) Meas. Sci. Technol. , vol.17 , Issue.4 , pp. 617
    • Wang, S.H.1    Tay, C.J.2
  • 16
    • 0028447006 scopus 로고
    • Measurement of length, surface form and thermal expansion coefficient of length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry
    • Lewis A 1994 Measurement of length, surface form and thermal expansion coefficient of length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry Meas. Sci. Technol. 6 1260
    • (1994) Meas. Sci. Technol. , vol.6 , pp. 1260
    • Lewis, A.1
  • 18
    • 0000131942 scopus 로고
    • The dispersion of standard air
    • Edlen B 1953 The dispersion of standard air J. Opt. Soc. Am. 43 339
    • (1953) J. Opt. Soc. Am. , vol.43 , Issue.5 , pp. 339
    • Edlen, B.1
  • 19
    • 0030404182 scopus 로고    scopus 로고
    • Refractive index of air: New equations for the visible and near infrared
    • Ciddor P E 1996 Refractive index of air: new equations for the visible and near infrared Appl. Opt. 35 1566
    • (1996) Appl. Opt. , vol.35 , Issue.9 , pp. 1566
    • Ciddor, P.E.1
  • 21
    • 33745452941 scopus 로고    scopus 로고
    • Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength synthesizer
    • Schibli T R, Minoshima K, Bitou Y, Hong F L, Inaba H, Onae A and Matsumoto H 2006 Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength synthesizer Opt. Express 14 5984
    • (2006) Opt. Express , vol.14 , Issue.13 , pp. 5984
    • Schibli, T.R.1    Minoshima, K.2    Bitou, Y.3    Hong, F.L.4    Inaba, H.5    Onae, A.6    Matsumoto, H.7
  • 22
    • 0027659135 scopus 로고
    • An updated Edlen equation for the refractive index of air
    • Birch K P and Downs M J 1993 An updated Edlen equation for the refractive index of air Metrologia 30 155
    • (1993) Metrologia , vol.30 , Issue.3 , pp. 155
    • Birch, K.P.1    Downs, M.J.2
  • 24
    • 0032114454 scopus 로고    scopus 로고
    • Length measurement using a regular crystalline lattice and a dual tunneling unit scanning tunneling microscope in a thermo-stabilized cell
    • Aketagawa M, Takada K, Kobayashi K, Takeshima N, Noro M and Nakayama Y 1998 Length measurement using a regular crystalline lattice and a dual tunneling unit scanning tunneling microscope in a thermo-stabilized cell Meas. Sci. Technol. 9 1076
    • (1998) Meas. Sci. Technol. , vol.9 , Issue.7 , pp. 1076
    • Aketagawa, M.1    Takada, K.2    Kobayashi, K.3    Takeshima, N.4    Noro, M.5    Nakayama, Y.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.